We are pleased to retain the essential elements of our traditional EMAG conference series, including outstanding invited speakers, a snapshot of ‘cutting edge’ contributed research talks and a wide-ranging exhibition.
The compressed format has been designed to accommodate the pressures of working from home and the constraints of our overseas speakers. Core sessions will run between 1400 and 1730 each afternoon, comprising 30-minute invited talks and a selection of ‘flash-style’ contributed talks. A plenary talk will also be presented on Tuesday evening, followed by an online informal social event.
We have always enjoyed strong support from the industrial community and are grateful that this has continued in EMAG2020. Our programme is complemented by an online exhibition that can be browsed in your own time. Within the exhibition software platform, you will be able to contact and interact with our sponsors directly.
All contributed talks will be in the ‘flash’ style and presenters were offered an optional online poster presentation alongside the online exhibition. Note that posters need not be manned, although there will be a mechanism for delegates to contact presenters directly. We hope that your presentation – and the conference – runs smoothly but please do consider that the conference format is new to the EMAG2020 team and that a hiccup-free experience is not guaranteed!
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Monday 6 July
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14:00
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Welcome Donald MacLaren, (University of Glasgow, UK)
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Session 1 Chairs: Miryam Arredondo-Arechavala & Donald MacLaren
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14:05
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(Invited) New phase contrast and diffractive imaging methods enabled by 4D-STEM Colin Ophus, (Berkeley Lab, USA)
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14:35
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Q & A
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14:45
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HOLZ-STEM Investigations of ceramic thin films via direct electron detection Thomas Macgregor, (University of Glasgow, UK)
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14:50
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Blind source separation in SPED datasets: machine learning assisted phase and orientation determination in multilayer oxide electronic thin film devices Alexander Zintler, (Technical University of Darmstadt, Germany)
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14:55
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On the magnetism of the Heusler Co2FeSi influenced by adjacent iron layers investigated using DPC Daniela Ramermann, (Bielefeld University, Germany)
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15:00
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Low dose scanning transmission electron microscopy techniques to examine Small molecular crystals Mark S'ari, (University of Leeds, UK)
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15:05
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Development of Fast Pixelated STEM Detector and its Applications using 4-Dimensional Dataset Takeo Sasaki, (JEOL UK Ltd, UK)
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15:15
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Q&A
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15:25
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Break
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Session 2 Chairs: Ana Sanchez & Sarah Harper
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15:45
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(Invited) Direct electron detection in electron energy loss spectroscopy Mitra Taheri, (Johns Hopkins University, USA)
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16:15
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Q&A
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16:25
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Quantitative electron ptychography of sub-stoichiometric metal-oxide nanoparticle catalysts combined with HAADF-STEM atom counting Emanuela Liberti, (University of Oxford, UK)
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16:30
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Structure determination of nano-precipitates found in La-doped SrTiO3 using 3D precession electron diffraction Ercin Duran, (The University of Manchester, UK)
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16:35
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Imaging polymer crystallinity and grain boundaries with STEM ptychography Hui Luo, (University of Oxford, UK)
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16:40
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Transforming transmission electron microscopy with MerlinEM electron counting detector Matus Krajnak, (Quantum Detectors Ltd, UK)
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16:50
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Q&A
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17:15
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Close
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Tuesday 7 July
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13:00
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Exhibition and Poster Viewing
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14:00
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Session 3 Chairs: Mike Dixon & Andy Brown
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14:05
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(Invited) Momentum-resolved STEM opportunities for dedicated contrast formation in electron microscopy of hard and soft matter Knut Muller Caspary (Ernst Ruska Centre, Jullich, Germany)
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14:35
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Q&A
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14:45
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Enhancing the performance of hybrid pixel detectors for high-energy transmission electron microscopy by using high-z sensors Kirsty Paton, (University of Glasgow, UK)
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14:50
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Coherent phase control of ultrashort electron pulses by traveling optical waves Armin Feist, (University of Göttingen, Germany)
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14:55
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High frame rate readout modes for CMOS based Direct Electron detectors Barnaby Levin, (Direct Electron LP, USA)
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15:00
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Ultrafast nano-imaging of the order parameter in a structural phase transition Thomas Danz, (University of Goettingen, Germany)
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15:05
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The Cheetah: The Direct Electron detector for electron microscopy Yemliha Bilal Kalyoncu, (Amsterdam Scientific Instruments, Netherlands)
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15:15
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Q&A
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15:25
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Break
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Session 4 Chairs: Jun Yuan & Larry Stoter
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15:45
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(Invited) Imaging light elements in beam sensitive materials using electron ptychography Peter Nellist (University of Oxford, UK)
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16:15
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Q&A
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16:25
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Precession electron diffraction using a direct electron detector Ian MacLaren, (University of Glasgow, UK)
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16:30
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Defect domain microstructure in UiO-66(Hf) revealed by scanning electron diffraction Sean Collins, (University of Leeds, UK)
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16:35
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Ptychographic phase imaging of heavy and light atoms in battery materials Weixin Song, (University of Oxford, UK)
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16:40
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BRUKER QUANTAX : Unique tools for nanoanalysis Heath Young, (Bruker, UK)
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16:50
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Low-dose and high-speed in-situ TEM with the K3 IS camera Stephen Mick (Gatan Inc., USA)
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17:00
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Q & A
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17:15
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Close
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19:00
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Session 5: Plenary Chair: Andy Brown
(Plenary) Ptychography - an old name for a modern revolution in imaging John Rodenburg (University of Sheffield, UK)
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19:45
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Q & A
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Wednesday 8 July
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13:00
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Exhibition and Poster Viewing
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14:00
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Session 6 Chairs: Laura Clark & Miryam Arredondo-Arechavala
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14:05
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(Invited) Lorentz microscopy using pixelated electron detectors Stephen McVitie (University of Glasgow, UK)
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14:35
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Q & A
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14:45
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Low-dose off-axis holography for biological specimens Christopher Edgcombe, (University of Cambridge, UK)
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14:50
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Thermomagnetic behaviour of an annealed FEBID-grown cobalt nanopattern examined by off-axis electron holography Trevor Almeida, (University of Glasgow, UK)
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14:55
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Energy-filtered secondary electron imaging for the study of degradation processes in paintings Pokorna Mika, (ISI CAS, Czech Republic)
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15:00
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Characterisation of pores in additively manufactured Ti by serial FIB sectioning Joanne Sharp, (University of Sheffield, UK)
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15:05
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Advanced Direct Detection cameras Bob Monteverde, (Direct Electron, USA)
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15:15
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Q&A
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15:25
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Break
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Session 7 Chairs: Conny Rodenburg & Jun Yuan
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15:45
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(Invited) Direct electron detectors for diffraction studies in the scanning electron microscope Carol Trager-Cowan (University of Strathlyde, UK)
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16:15
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Q&A
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16:25
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Study of PHA producing cyanobacteria by cryo-SEM KateÅ™ina Mrázová, (Institute of Scientific Instruments of the CAS, v. v. i., Czech Republic)
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16:30
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Exploring materials with higher acuity electron backscatter diffraction– a combined approach using new machine learning algorithms and direct detectors in the scanning electron microscope Ben Britton, (Imperial College London, UK)
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16:35
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Advances in speed and resolution with Direct Electron EBSD Fulin Wang, (UC Santa Barbara, USA)
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16:40
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Direct calibration of retractable annular BSE detector Radim Skoupy, (Institute of Scientific Instruments of the CAS, v. v. i., Czech Republic)
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16:45
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Latest developments in EDS and EBSD David Westmoreland, (Oxford Instruments, UK)
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16:55
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FocalPlane, a new microscopy community site for developers and researchers Christos Kyprianou, (FocalPlane ,UK)
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17:05
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Q&A
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17:30
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Close
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