EMAG2020 will show-case the modelling, development, use and analysis of direct electron detectors within electron microscopy. Distinguished speakers will present snap-shots of the opportunities enabled by a new generation of pixellated electron detectors, alongside contributed oral presentations and interactive poster sessions. The programme will be complemented by a virtual table-top trade exhibition, involving some of the largest manufacturers of electron microscopes and related technologies.

The Electron Microscopy and Analysis Group conferences bring together the UK electron microscopy, materials and physical sciences communities within an international context. They have established a reputation for providing a vibrant snapshot of the ‘state of the art’ in electron microscopy and its application since the inaugural gathering in 1946. EMAG conferences are valued in particular for providing a platform for students to present their work alongside more established researchers.

This year’s theme, Microscopy Enabled by Direct Electron Detection, is intended to capture the tremendous new science now being enabled by modern detector technologies. It is fitting that a conference focused on improved technologies and methodologies for seeing the world should be timed for the year 2020, a number that is synonymous with perfect vision.

Key dates

Abstract submission deadline [extended]:

7 June 2020

Registration deadline:

5 July 2020