Invited Speakers

Lorentz microscopy using pixelated electron detectors
Prof. Stephen McVitie (University of Glasgow, UK)
Developments in 4D STEM for momentum resolution and differential phase contrast imaging
Dr. Knut Muller Caspary (Jullich, Germany)
Imaging light elements in beam sensitive materials using electron ptychography
Prof. Peter Nellist (University of Oxford, UK)
New phase contrast and diffractive imaging methods enabled by 4D-STEM
Prof. Colin Ophus (Berkeley, USA)
Direct electron detection in electron energy loss spectroscopy
Prof. Mitra Taheri (Johns Hopkins University, USA)
Ptychography - an old name for a modern revolution in imaging
Prof. John Rodenburg (University of Sheffield, UK)
Direct electron detectors for diffraction studies in the scanning electron microscope
Dr. Carol Trager-Cowan (University of Strathlyde, UK)

Abstract submission deadline [extended]:

7 June 2020

Registration deadline:

5 July 2020

Co-sponsors

Royal Microscopical Society